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  Date: 15th Feb 2011

Agilent and Altair semiconductor partner on LTE testing

Agilent Technologies and Altair Semiconductor have announced they will jointly conduct interoperability testing and validation testing using Altair's 4G LTE chipset in conjunction with the Agilent PXT wireless communications test set and N6070A-series signaling conformance test software.

Altair's LTE chip portfolio includes the FourGee-3100 baseband and FourGee-6200 RFIC chipsets. The FourGee-3100 is a 3GPP LTE baseband processor that supports LTE category 3 throughputs (100Mbps/50Mbps DL/UL respectively). The chip implements a 20-MHz MIMO receiver and is based on a proprietary, cutting-edge O2P software-defined radio processor.

"Having a prestigious test equipment vendor like Agilent on board for interoperability testing is of huge importance to Altair," said Eran Eshed, cofounder and VP of Marketing and Business Development at Altair Semiconductor. "Verifying and certifying leading-edge designs is always a challenge, and this collaboration ensures that the chipset technology and the testing solutions move forward together at an accelerated pace, allowing our products to be brought to market quickly and efficiently."

"Our work with Altair lends to our on-going interoperability testing with the PXT and validation of Agilent's conformance test solutions," said Guy Séné, vice president and general manager of Agilent's Microwave and Communications Division. "Altair's chipset will be used to further increase the capability of our LTE test platforms, expanding our design verification and conformance test capability into new operating bands."

 
          
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