Date:14th July 2011
ELMOS Semiconductor selects X-Series test
equipment from LTX-Credence to test its chips
LTX-Credence Corporation has announced that ELMOS Semiconductor
AG has selected the X-Series as its semiconductor test platform
for testing its automotive chips including safety, engine
control and in-vehicle communication devices.
LTX-Credence Corporation says ELMOS Semiconductor selected
the X-Series based on three key criteria: the portfolio
of power instruments available in the test platform, the
ease of use for test program generation and debug, and the
convincing multisite test efficiency. Another contributing
factor for the X-Series selection was its robust installed
base at OSATs (outsourced assembly and test companies) according
to LTX-Credence Corporation.
Reinhard Senf, COO of ELMOS Semiconductor, commented, "Our
selection of the X-Series as our future test platform was
based on several factors including technical capability,
cost-of-test advantages, and availability at multiple OSATs.
Our engineering team analyzed these key factors for each
of the vendors under consideration and the X-Series proved
to be a top performer."
Dave Tacelli, chief executive officer and president of
LTX-Credence, commented, "Automotive semiconductor
device testing is a fast growing driver of our business,
and the team at ELMOS Semiconductor recognized that LTX-Credence
products are meeting the demanding technology, stringent
quality and strong economic requirements of the automotive
industry. We look forward to continue to work with ELMOS,
one of the top automotive ASIC and ASSP device manufacturers
in the world."