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  Date:14th July 2011

ELMOS Semiconductor selects X-Series test equipment from LTX-Credence to test its chips

LTX-Credence Corporation has announced that ELMOS Semiconductor AG has selected the X-Series as its semiconductor test platform for testing its automotive chips including safety, engine control and in-vehicle communication devices.

LTX-Credence Corporation says ELMOS Semiconductor selected the X-Series based on three key criteria: the portfolio of power instruments available in the test platform, the ease of use for test program generation and debug, and the convincing multisite test efficiency. Another contributing factor for the X-Series selection was its robust installed base at OSATs (outsourced assembly and test companies) according to LTX-Credence Corporation.

Reinhard Senf, COO of ELMOS Semiconductor, commented, "Our selection of the X-Series as our future test platform was based on several factors including technical capability, cost-of-test advantages, and availability at multiple OSATs. Our engineering team analyzed these key factors for each of the vendors under consideration and the X-Series proved to be a top performer."

Dave Tacelli, chief executive officer and president of LTX-Credence, commented, "Automotive semiconductor device testing is a fast growing driver of our business, and the team at ELMOS Semiconductor recognized that LTX-Credence products are meeting the demanding technology, stringent quality and strong economic requirements of the automotive industry. We look forward to continue to work with ELMOS, one of the top automotive ASIC and ASSP device manufacturers in the world."


 
          
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