ADCs support lesser signal chain power
Analog devices unveiled high precision successive approximation analog to digital devices the 2-MSPS 18 bit AD4003 and 16-bit AD4000 SAR ADCs which enable mobile test and measurement to operate for long duration during test fields to improve measurement accuracy and repeatability.
Features such as high input-impedance mode and span-compression mode reduce the design challenge associated with the ADC driver stage and increase the flexibility of amplifier selection. The high input-impedance mode allows the use of low-power precision amplifiers to directly drive the ADC, and reduces the signal-chain power demands.
In addition, the internal overvoltage protection removes the need for external protection devices, and the span compression enables the ADC driver stage to operate from the same supply rail as the ADC, thus simplifying power management.
This combination supports increased channel density while lowering the system-level power requirements, without compromising performance.
The AD400x series includes 20-, 18-, and 16-bit SAR ADCs with speed options from 500 kSPS to 2 MSPS. These IC's enable mobile test and measurement to operate for long duration during test fields to improve measurement accuracy and repeatability.