JEDEC' standard for measuring proton radiation on devices
Date: 16/10/2013
JEDEC Solid State Technology Association has published JESD234 Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices. Developed in response to the present lack of a prevailing industry standard for proton induced upset testing for electronic devices used in outer space; the new standard assists with proton testing in several areas, including pre-trip planning, decision making during the test, and post-exposure planning and analysis. JESD234 is available for free download from the JEDEC website: http://www.jedec.org/standards-documents/results/jesd234
The new standard also forewarns the “bounds” to an acceptable proton test covered by this standard. For example, items discussed as being excluded in this standard are low energy proton testing (< 5MeV), proton tests with excessive total dose and the assumption that latchup testing is energy independent. JESD234 assures the user that:
bounding an acceptable indirect ionization upset test as being done with energies between 40 – 500 MeV consideration must be given to device overlayers and package lids a discussion on the clarity between destructive and non-destructive events angular testing is different from that described in heavy ion testing and provides a listing of proton induced dominant SEEs.
“The radiation effects test and programmatic community has requested a proton SEE test standard for many years,” said Reed Lawrence, Chairman of the JC-13.4 Subcommittee for Radiation Hardness: Assurance and Characterization. He added: “JEDEC believes this new standard will meet the community’s needs for a test able to simulate the harsh environment of outer space.”
